Using an ECM to Model HiPot Tests

circuit schematic for HiPot test modelling

Author: Siddharth Kurwa A DC high-potential test (HiPot) is used to detect manufacturing defects in the electrode stack/jelly roll. During the test, a high voltage (orders of magnitude higher than the cell operating voltage) is applied to the cell to screen out early-in-life and latent risks from the production cell population. It is preferred to … Read more